Title | Mr. | First Name | Khushwant | Last Name | Sehra | ||
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Designation | Assistant Professor | ||||||
Department | Faculty of Technology | ||||||
khushwantsehra@fot.du.ac.in | |||||||
Webpage | |||||||
Phone.no | . |
Employement Info | |||||||
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Employee Type | Nature Of Employment | ||||||
Teaching | Permanent |
Educational Qualifications | |||||||
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Degree/Certification Name | Institution | Year of Completion | |||||
PG | Guru Gobind Singh Indraprastha University | 2019 | |||||
UG | University of Delhi | 2017 | |||||
HSC | CBSE | 2013 | |||||
SSC | CBSE | 2011 |
Qualifications | |||||||
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Examination Name | Conducting Body | Date of Passing | |||||
NET | UGC-NET | 12-07-2019 |
Fellowship Details | |||||||
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Name Of Fellowship | Awarding Body | Fellowship Level | |||||
Summer Research Fellowship 2016 - Bhabha Atomic Research Centre, Mumbai | IASc – INSA – NASI | National | |||||
Summer Research Fellowship 2018 - University of Delhi | IASc – INSA – NASI | National |
Courses/Subjects Taught | ||||||
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Teaching Activity Type | Course Title | Semester | Total Assigned Classes | Number of Classes Taught | Duration | |
Workshop | ELECTRONICS WORKSHOP (SEC) - ECE B2 | 1 | 4 | 8 | 10-11-2023 To 10-01-2024 (2 months) | |
Practical | INTRODUCTION TO ELECTRICAL and ELECTRONICS ENGINEERING (DSC - 5) - EE A1 | 1 | 2 | 5 | 09-11-2023 To 07-12-2023 (28 days) | |
Workshop | ELECTRONICS WORKSHOP (SEC) - ECE B1 | 1 | 4 | 2 | 09-11-2023 To 20-11-2023 (11 days) | |
Workshop | ELECTRONICS WORKSHOP (SEC) - ECE A1 | 1 | 4 | 8 | 09-11-2023 To 10-01-2024 (2 months, 1 days) | |
Workshop | ELECTRONICS WORKSHOP (SEC) - ECE A2 | 1 | 4 | 5 | 10-11-2023 To 15-12-2023 (1 months, 5 days) | |
Practical | GE: MATLAB and its Applications | 1 | 2 | 9 | 08-11-2023 To 10-01-2024 (2 months, 2 days) | |
Lecture | GE: MATLAB and its Applications | 1 | 2 | 9 | 07-11-2023 To 10-01-2024 (2 months, 3 days) | |
Lecture | MATHEMATICS - I (DSC - 1) | 1 | 3 | 28 | 08-11-2023 To 10-01-2024 (2 months, 2 days) | |
Tutorial | MATHEMATICS - II (DSC - 4) - Tutorial | 2 | 2 | 13 | 01-02-2024 To 25-05-2024 (3 months, 24 days) | |
Workshop | ELECTRONICS WORKSHOP (SEC) - ECW3 | 2 | 4 | 10 | 01-02-2024 To 25-05-2024 (3 months, 24 days) | |
Workshop | ELECTRONICS WORKSHOP (SEC) - ECW2 | 2 | 4 | 11 | 01-02-2024 To 25-05-2024 (3 months, 24 days) | |
Lecture | MATHEMATICS - II (DSC - 4) - Lecture | 2 | 3 | 24 | 01-02-2024 To 25-05-2024 (3 months, 24 days) |
Research Publications | |||||||
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Title of Article | Type of Publication | Name of Journal | ISSN | Journal Volume | Year | Link to Article | DOI (Digital Object Identifier) |
On the Single-Event Burnout Performance of a GaN HEMT With Sunken Source-Connected Field Plate Architecture | Research Papers in Scopus Listed Journals | IEEE Transactions on Electron Devices | 1557-9646 | 71 | 2024 | https://doi.org/10.1109/TED.2024.3396781 | 10.1109/TED.2024.3396781 |
A Comparative Study of n- and p- Channel FeFETs with Ferroelectric HZO Gate Dielectric | Research Papers in Scopus Listed Journals | Solids | 2673-6497 | 4 | https://doi.org/10.3390/solids4040023 | 10.3390/solids4040023 | |
On the Double Channel Engineering of Dual Gate AlGaN/GaN HEMTs for Heavy Ion Sensing Applications | Research Papers in Scopus Listed Journals | Micro and Nanostructures | 2773-0123 | 182 | https://doi.org/10.1016/j.micrna.2023.207653 | 10.1016/j.micrna.2023.207653 | |
Physical Insights into the reliability of Sunken Source Connected Field Plate GaN HEMTs for mm-Wave Applications | Research Papers in Scopus Listed Journals | Microelectronics Reliability | 1872-941X | 148 | https://doi.org/10.1016/j.microrel.2023.115170 | 10.1016/j.microrel.2023.115170 | |
Impact of Barrier Layer Thickness on DC and RF performance of AlGaN/GaN High Electron Mobility Transistors | Research Papers in Scopus Listed Journals | Applied Physics A | 1432-0630 | 129 | http://doi.org/10.1007/s00339-023-06803-x | 10.1007/s00339-023-06803-x | |
Efficacy of back barrier engineered Π - Gate InAlN/GaN HEMTs for high power applications | Research Papers in Scopus Listed Journals | Journal of Physics D: Applied Physics | 1361-6463 | 56 | http://doi.org/10.1088/1361-6463/acdf6d | 10.1088/1361-6463/acdf6d | |
Investigation of SiNx Passivated Dual Field Plate AlGaN/GaN HEMTs on Silicon Carbide and Sapphire Substrates Under Radiation Environment | Research Papers in Scopus Listed Journals | Silicon | 1876-9918 | 15 | https://doi.org/10.1007/s12633-023-02506-3 | 10.1007/s12633-023-02506-3 | |
Efficacy of Π – Gate in RF Power Performance of Thin GaN Buffer AlGaN/GaN HEMTs | Research Papers in Scopus Listed Journals | IEEE Transactions on Electron Devices | 1557-9646 | 70 | https://doi.org/10.1109/TED.2023.3262228 | 10.1109/TED.2023.3262228 | |
A Low-Resolution Real-Time Face Recognition using Extreme Learning Machine and its Variants | Research Papers in Scopus Listed Journals | The Imaging Science Journal | 1743-131X | 71 | https://doi.org/10.1080/13682199.2023.2183544 | 10.1080/13682199.2023.2183544 | |
XAI-FR: Explainable AI-Based Face Recognition Using Deep Neural Networks | Research Papers in Scopus Listed Journals | Wireless Personal Communications | 1572-834X | 129 | https://doi.org/10.1007/s11277-022-10127-z | 10.1007/s11277-022-10127-z | |
Secure Digital Image Watermarking using Memristor based Hyperchaotic circuit, | Research Papers in Scopus Listed Journals | The Visual Computer Computer | 1432-2315 | 39 | https://doi.org/10.1007/s00371-022-02601-3 | 10.1007/s00371-022-02601-3 | |
Multilayer perceptron–random forest based hybrid machine learning–neural network model for GaN high electron mobility transistor's parameter estimations | Research Papers in Scopus Listed Journals | International Journal of RF and Microwave Computer-Aided Engineering | 1099-047X | 32 | https://doi.org/10.1002/mmce.23191 | 10.1002/MMCE.23191 | |
A Π - Shaped Gate p-GaN HEMT for Reliable Enhancement Mode Operation | Research Papers in Scopus Listed Journals | Microelectronics Reliability | 1872-941X | 133 | https://doi.org/10.1016/j.microrel.2022.114544 | 10.1016/j.microrel.2022.114544 | |
Impact of Gamma Radiations on Static, Pulsed I-V and RF Performance Parameters of AlGaN/GaN HEMT | Research Papers in Scopus Listed Journals | IEEE Transactions on Electron Devices | 1557-9646 | 69 | https://doi.org/10.1109/TED.2022.3161402 | 10.1109/TED.2022.3161402 | |
Interplay Between γ–Ray Irradiation and 3DEG for Dosimeter Applications | Research Papers in Scopus Listed Journals | IEEE Access | 2169-3536 | 10 | https://doi.org/10.1109/ACCESS.2022.3155764 | 10.1109/ACCESS.2022.3155764 | |
TCAD based Investigation of Single Event Transient Effect in Double Channel AlGaN/GaN HEMT | Research Papers in Scopus Listed Journals | IEEE Transactions on Device and Materials Reliability | 1558-2574 | 21 | http://doi.org/10.1109/TDMR.2021.3103238 | 10.1109/TDMR.2021.3103238 | |
Robust and Secure Digital Image Watermarking Technique Using Arnold Transform and Memristive Chaotic Oscillators | Research Papers in Scopus Listed Journals | IEEE Access | 2169-3536 | 9 | https://doi.org/10.1109/ACCESS.2021.3079319 | 10.1109/ACCESS.2021.3079319 | |
Proton irradiation effects on buffer-free gallium nitride on silicon carbide high electron mobility transistor-based radio frequency power amplifier | Research Papers in Scopus Listed Journals | Semiconductor Science and Technology | 1361-6641 | 36 | https://doi.org/10.1088/1361-6641/abe2df | 10.1088/1361-6641/abe2df | |
Impact of Heavy Ion Particle Strike Induced Single Event Transients on Conventional and π – Gate AlGaN/GaN HEMTs | Research Papers in Scopus Listed Journals | Semiconductor Science and Technology | 1361-6641 | 36 | https://doi.org/10.1088/1361-6641/abdba3 | 10.1088/1361-6641/abdba3 | |
Advances in DC/RF Performance of AlGaN/GaN MIS – HEMT by Incorporating Dual Metal Gate Architecture | Research Papers in Scopus Listed Journals | IETE Technical Review | 0974-5971 | 39 | https://doi.org/10.1080/02564602.2020.1843555 | 10.1080/02564602.2020.1843555 | |
Optimization of π – Gate AlGaN/AlN/GaN HEMTs for Low Noise and High Gain Applications | Research Papers in Scopus Listed Journals | Silicon | 1876-9918 | 14 | https://doi.org/10.1007/s12633-020-00805-7 | 10.1007/s12633-020-00805-7 | |
Facile preparation of Silicon/ZnO thin film heterostructures and ultrasensitive toxic gas sensing at room temperature: Substrate dependence on specificity | Research Papers in Scopus Listed Journals | Analytica Chimica Acta | 1873-4324 | 1039 | https://doi.org/10.1016/j.aca.2018.07.036 | 10.1016/j.aca.2018.07.036 |
Non-Journal Publications | |||||||
---|---|---|---|---|---|---|---|
Title of Publication | Type of Publication | Publisher | Role | ISBN | Year | Link to Publication | Level |
Comparative Investigation of Single and Double Channel AlGaN/GaN HEMTs for LNAs | Chapters in Books | Springer Proceedings in Physics, 2024 | Co-Author | 978-981-97-1571-8 | 2024 | https://doi.org/10.1007/978-981-97-1571-8_15 | International |
Investigation of Single Event Effects in Buffer – Free GaN – on – SiC HEMT | Full Paper in Conference Proceedings/Other | IEEE International Conference on Emerging Electronics (IEEE – ICEE), 2020 | Co-Author | 978-1-7281-8660-3 | 2023 | https://doi.org/10.1109/ICEE50728.2020.9776925 | International |
Implications of Field Plate HEMT Towards Power Performance at Microwave X - Band | Chapters in Books | Springer Nature, VLSI Design and Test (VDAT 2022) | Author | 978-3-031-21514-8 | 2022 | https://doi.org/10.1007/978-3-031-21514-8_6 | International |
Emerging Device Architectures for Space Electronics | Chapters in Books | Springer Nature, HEMT Technology and Applications | Author | 978-981-19-2165-0 | 2022 | https://doi.org/10.1007/978-981-19-2165-0_13 | International |
TCAD Based Reliability Assessment of Recess Gate AlGaN/GaN HEMT with Negative Gate Bias Induced Stress | Full Paper in Conference Proceedings/Other | IEEE International Conference on Emerging Electronics (IEEE – ICEE), 2020 | Co-Author | 978-1-7281-8660-3 | 2022 | https://doi.org/10.1109/ICEE50728.2020.9777048 | International |
An Asymmetric π – Gate MOSHEMT Architecture for High Frequency Applications | Chapters in Books | Springer’s Lecture Notes in Networks and Systems - Computers and Devices for Communication, 2019 | Author | 978-981-15-8366-7 | 2021 | https://doi.org/10.1007/978-981-15-8366-7_67 | International |
Enhancement in Electrical Characteristics of AlGaN/GaN HEMT Using Gate Engineered Dielectric Pocket Dual-Metal Gate | Chapters in Books | Springer’s Lecture Notes in Networks and Systems - Computers and Devices for Communication, 2019 | Co-Author | 978-981-15-8366-7 | 2021 | https://doi.org/10.1007/978-981-15-8366-7_54 | International |
Degradation Mechanisms in a Proton Irradiated HEMT with 3DEG Conduction and 3DHG as a Back Barrier | Full Paper in Conference Proceedings/Other | IEEE International Conference on Nanotechnology (IEEE-NANO), 2021 | Author | 978-1-6654-4156-8 | 2021 | https://doi.org/10.1109/NANO51122.2021.9514295 | International |
Hybrid NN Model to Predict the Radiation Damage in GaN HEMTs | Full Paper in Conference Proceedings/Other | IBM AI Compute, 2021 | Co-Author | 2021 | https://www.zurich.ibm.com/pdf/aics/3.16_Mishra_Ashutosh_DDUC_AICS2021_Poster.pdf | International | |
TCAD Investigation of Gate - Lag Measurements on Conventional and π - Gate AlGaN/GaN HEMTs | Full Paper in Conference Proceedings/Other | IEEE International Conference on Nanotechnology (IEEE-NANO), 2020 | Author | 978-1-7281-8264-3 | 2020 | https://doi.org/10.1109/NANO47656.2020.9183484 | International |
Memristor Based Cryptographic Information Processing for Secured Communication Systems | Full Paper in Conference Proceedings/Other | IEEE International Conference on Devices, Circuits and Systems (ICDCS), 2020 | Co-Author | 978-1-7281-6368-0 | 2020 | https://doi.org/10.1109/ICDCS48716.2020.243573 | International |
Comparison of Linearity and Intermodulation Distortion Metrics for T - and Pi - Gate HEMT | Full Paper in Conference Proceedings/Other | IEEE International Conference on Electrical, Electronics and Computer Engineering, 2019 | Author | 978-1-7281-3455-0 | 2020 | https://doi.org/10.1109/UPCON47278.2019.8980221 | International |
Optimization of Asymmetric π Gate HEMT for Improved Reliability & Frequency Applications | Full Paper in Conference Proceedings/Other | IEEE International Nanoelectronics Conference (INEC), 2019 | Author | 978-1-7281-1237-4 | 2019 | https://doi.org/10.1109/INEC.2019.8853857 | International |
HOG Based Facial Recognition Approach Using Viola Jones Algorithm and Extreme Learning Machine | Chapters in Books | Springer Nature, Computational Science and Its Applications (ICCSA 2019) | Author | 978-3-030-24308-1 | 2019 | https://doi.org/10.1007/978-3-030-24308-1_35 | International |
Investigation of Field Plate Misalignment on Electrical Characteristics of AlGaN/ GaN HEMT | Full Paper in Conference Proceedings/Other | IEEE Uttar Pradesh Section International Conference on Electrical, Electronics and Computer Engineering, 2018 | Author | 978-1-5386-5002-8 | 2019 | https://doi.org/10.1109/UPCON.2018.8596909 | International |
Neuro Fuzzy Architecture for Gray Scale Image Watermarking using Fractal Dimensions | Full Paper in Conference Proceedings/Other | IEEE International Joint Conference on Neural Networks (IJCNN), Rio de Janeiro, Brazil | Co-Author | 2161-4407 | https://doi.org/10.1109/IJCNN.2018.8489350 | International | |
NI MULTISIM Implementation of Memristor Based Secured Communication System | Full Paper in Conference Proceedings/Other | Paramount Publishing House | Author | 978-93-5254-496-7 | https://www.rajgurucollege.com/images/Research/National-Conference/Proceedings%20Conference%20%20NCAECA.pdf#page=29 | National |
Honors and Awards | |||||||
---|---|---|---|---|---|---|---|
Name of the Award | Awarding Body | Award Category | Level | Award Date | |||
Certificate of Merit for securing 1st position in 2nd Semester of B. Tech Electronics. | Deen Dayal Upadhyaya College, University of Delhi | Academic | University | 01-01-2014 | |||
Certificate of Merit for securing 1st position in 4th Semester of B. Tech Electronics. | Deen Dayal Upadhyaya College, University of Delhi | Academic | University | 01-01-2015 | |||
Certificate of Merit for securing 2nd position in 5th Semester of B. Tech Electronics. | Deen Dayal Upadhyaya College, University of Delhi | Academic | University | 01-01-2015 | |||
Certificate of Merit for securing 1st position in 6th Semester of B. Tech Electronics. | Deen Dayal Upadhyaya College, University of Delhi | Academic | University | 01-01-2016 | |||
Certificate of Best Poster Awarded at the Research Display, Convocation Ceremony of University of Delhi | University of Delhi | Research | University | 19-11-2016 | |||
Certificate of Merit for securing 1st Rank in University | Guru Gobind Singh Indraprastha University | Academic | University | 05-11-2019 | |||
Certificate for Best Paper/ Author of the session on Semiconductor Devices | IEEE International Conference on Electrical, Electronics and Computer Engineering 2019 | Research | International | 10-11-2019 | |||
Cash Prize for Best Poster Award | University of Calcutta - International Conference on Computers and Devices for Communication (CODEC) | Research | International | 20-11-2019 | |||
National Innovation Contest 2020 - Finalist | Ministry of Education (MoE), Government of India | Innovation | National | 01-05-2021 | |||
White Paper - Simulation Standard for 'TCAD Investigation of Total Ionizing Dose (TID) Effects on Gallium Nitride HEMTs' | Silvaco Inc., USA | Innovation | International | 04-01-2021 |